The study of new semiconducting materials, high temperature superconductors, photovoltaic devices, and organic electronic materials typically requires low-level sourcing and measurement because the materials are often nanostructures. The trouble is, the types of low-level measurements required to fully characterise such small structures are often contaminated with significant levels of power line, thermal, and other types of ambient noise signals.
A new technical note from our partners Lake Shore Cryotronics, “A New Approach to Improving Confidence in Low-Level Measurements of Nanostructures” examines existing methods and how well they address the challenge of noise in the measurement. And it also provides an in-depth look at a solution: a synchronised and modular AC + DC sourcing and measurement system that utilises optimum sensitivity, noise rejection, and uninterrupted acquisition of data as a means to more confidently characterise such structures.
